TeledyneFLIR – X8580-HS SLS

The FLIR X8580-HS SLS is a high-speed, high-definition longwave infrared (LWIR) camera designed for scientists and engineers who demand precision in capturing fast-moving events, performing custom radiometric measurements, and detecting defects in composites, solar cells, and electronics. Featuring a 1280 × 1024 Strained Layer Superlattice (SLS) detector, this science-grade camera delivers crisp thermal imagery with integration times up to 10x shorter than MWIR InSb cameras, ensuring stop-motion clarity for high-speed applications. With advanced features like a four-position motorized filter wheel, FLIR motorized focus lenses, and high-speed data interfaces, the X8580-HS SLS is the ultimate tool for research, non-destructive testing, and thermal analysis in dynamic environments.

Key Features of the FLIR X8580-HS SLS

• High-Definition Imaging: 1280 × 1024 resolution with a 12 µm pitch SLS detector, operating in the 7.5–12.5 µm spectral range for detailed thermal images.
• Blazing-Fast Performance: Programmable frame rates up to 181 Hz (full window) and subwindow modes up to 6,000 Hz, with integration times as low as 270 ns for capturing rapid events.
• Wide Temperature Range: Measures from -20°C to 300°C (-4°F to 572°F) standard, with optional ranges up to 3000°C (5432°F) using ND filters.
• Extended SSD Recording: Records over two hours of full HD thermal data to a removable 4 TB NVMe SSD with zero dropped frames, plus 64 GB RAM for up to 23,000 frames.
• High-Speed Data Streaming: Simultaneous 10 GigE, CXP 2.1, and Camera Link Full interfaces ensure rapid, reliable data transfer for real-time analysis.
• Precise Timing & Synchronization: Proprietary triggering, IRIG-B time stamping, and sync modes deliver accurate, on-time recordings.
• FLIR Research Studio Integration: Streamlined software for recording, analyzing, and sharing thermal data across multiple FLIR cameras.

Applications

The FLIR X8580-HS SLS is tailored for demanding applications, including:

• Non-Destructive Testing: Detect delaminations, impact damage, and defects in composites, semiconductors, and batteries.
• Scientific Research: Capture thermal data for aerospace, material science, and hypervelocity impact studies.
• Electronics Inspection: Identify failure points in solar cells, PCBs, and microelectronics with high precision.
• Thermal Mapping: Perform stress analysis and radiometric measurements in dynamic testing scenarios.

Why Choose the FLIR X8580-HS SLS?

With a thermal sensitivity of 40 mK (typical) and a 14-bit dynamic range, the X8580-HS SLS delivers low-noise, high-accuracy thermal imagery. Its motorized lens compatibility (17 mm to 200 mm) and user-swappable 1-inch filters enhance flexibility, while the linear Sterling cooler ensures reliable operation in temperatures from -20°C to 50°C. The camera’s robust connectivity and FLIR Research Studio integration streamline data analysis, making it ideal for both lab and field research. Compact yet powerful at 6.35 kg (14 lbs), this LWIR camera is built to meet the needs of advanced R&D professionals.

Technical Specifications

• Resolution: 1280 × 1024 pixels
• Detector Pitch: 12 µm
• Spectral Range: 7.5–12.5 µm
• Camera f-number: f/2.5
• NETD: 40 mK typical
• Frame Rate: ~0.5 Hz to 181 Hz (full window)
• Integration Time: 270 ns to ~full frame
• Weight (w/o lens): 6.35 kg (14 lbs)
• Operating Temperature: -20°C to 50°C (-4°F to 122°F)

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Note: This product may be subject to ITAR or EAR export restrictions. Contact us for jurisdiction and classification details.