TeledyneFLIR – X8580-HS InSb

The FLIR X8580-HS InSb midwave infrared camera is engineered for scientists and engineers tackling high-speed thermal events in scientific research, electronics testing, and non-destructive analysis. With a 1280 × 1024 HD resolution and blazing-fast frame rates up to 181 Hz, this advanced InSb camera captures detailed thermal imagery of fast-moving subjects and rapid temperature changes in the lab or on the test range. Featuring a four-position motorized filter wheel, FLIR motorized focus lenses, and high-speed interfaces, the X8580-HS ensures superior recording quality and seamless data management for demanding R&D applications.

Key Features of the FLIR X8580-HS InSb

• High-Definition Imaging: Delivers 1280 × 1024 resolution with a 12 µm detector pitch, operating in the 1.5–5.0 µm spectral range for crisp, detailed thermal images.
• Fast Frame Rates & Integration: Programmable frame rates from 0.5 Hz to 181 Hz (full window) and integration times as low as 270 ns enable precise stop-motion capture of high-speed events.
• Extended Temperature Range: Measures temperatures from -20°C to 300°C (-4°F to 572°F) standard, with optional ranges up to 3000°C (5432°F) using neutral density filters.
• Advanced Data Streaming: Supports 10 GigE, CXP 2.1, and Camera Link Full interfaces for unmatched image clarity and rapid data transfer with zero dropped frames.
• Extended SSD Recording: Records over two hours of full HD thermal data directly to a removable 4 TB NVMe SSD, ensuring no critical data is lost.
• Precise Timing System: Proprietary triggering, synchronization, and IRIG time stamping ensure accurate, on-time recording for reliable results.
• FLIR Research Studio Integration: Streamlined GUI for displaying, recording, analyzing, and reporting thermal data from multiple FLIR cameras simultaneously.

Applications

The FLIR X8580-HS InSb excels in a variety of high-stakes applications, including:

• Electronics Testing: Detect points of failure in composites, solar cells, and microelectronics with exceptional precision.
• Scientific Research: Capture detailed thermal data for material science, aerospace, and ballistics experiments.
• Non-Destructive Testing: Identify structural defects in materials without invasive methods.
• Thermal Mapping: Perform stress analysis and thermal characterization in hypervelocity impact testing.

Why Choose the FLIR X8580-HS InSb?

With a thermal sensitivity of 30 mK (typical) and 14-bit dynamic range, the X8580-HS delivers low-noise imagery and accurate radiometric measurements. Its motorized lens compatibility and four-position filter wheel enhance flexibility, while the linear Sterling cooler ensures reliable performance in harsh environments. The camera’s compact design (249 × 157 × 147 mm) and robust connectivity options make it ideal for both lab and field use. Whether you’re conducting advanced radiometry or high-speed event analysis, the X8580-HS provides publication-quality results with minimal setup time.

Technical Specifications

• Resolution: 1280 × 1024 pixels
• Detector Pitch: 12 µm
• Spectral Range: 1.5–5.0 µm
• Camera f-number: f/2.5
• Frame Rate: 0.5 Hz to 181 Hz (full window)
• Integration Time: 270 ns to ~full frame
• Thermal Sensitivity: 30 mK typical
• Weight (w/o lens): 6.35 kg (14 lbs)
• Operating Temperature: -20°C to 50°C (-4°F to 122°F)

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Note: This product may be subject to ITAR or EAR export restrictions. Contact us for jurisdiction and classification details.